The annual Association of Test Publishers (ATP) Conference, Innovations in Testing, is scheduled for March 5-8, 2017.
Widely recognized as the top venue to exchange ideas, best practices, research and applications for the testing industry. Pacific Metrics will be hosting an exhibitors booth and sponsoring the event. We’re proud of our association with ATP and look forward to another exciting event! In addition, our esteemed colleagues will be presenting on two topics: Fairness in Automated Scoring and Universal Test Assembly with CAT.
If you’d like to visit us or view a product demo, we’ll be in Booth # 58 & 59, right next to ACT. Click HERE to view the full program.
The 2016 Conference on Test Security will be held on October 18-20 in Cedar Rapids. Our Director of Research Innovation, Dr. Wim J. van der Linden, will be hosting a presentation on the topic of “Bayesian Detection of Cheating on Tests.”
What is Bayesian Detection and what are the advantages?
A Bayesian approach to the detection of cheating on tests has several advantages relative to classical statistical hypothesis testing. First, it is based on the correct probability distribution of the number of items on which the test taker has cheated given his observed number of aberrant responses. Second, whereas classical hypothesis testing only allows us to control its Type I error, the Bayesian approach does allow us to directly account for the incidence of cheating in the population of test takers. Third, the approach resolves the problem of whether or not to condition on the responses by the source in the detection of answer copying, which has plagued the literature since Frary et al. (1977). Fourth, it automatically accounts for the presence of estimation error in any of the parameters of the psychometric model (e.g., ability parameters). A natural Bayesian way of presenting evidence of cheating is through reporting of its posterior odds given the responses observed for the test taker. In this presentation we will show the odds for four different types of cheating: item pre-knowledge, item harvesting, answer copying, and fraudulent erasures on answer sheets. For each of these types of cheating, the odds can be calculated using a simple, extremely fast algorithm known as the Lord-Wingersky algorithm in test theory. The only difference exists in the parameters that need to be fed into the algorithm.
For more information about this presentation, please refer to the description of Presentation 23 in the event program. https://cete.ku.edu/2016-conference-test-security
1200 Collins Road Northeast, Cedar Rapids, IA 52402, United States
The theme of this year’s E-ATP Conference is “Gaining Advantage Through Assessment.”
Our very own, Dr. Michelle Barrett and Dr. Wim van der Linden will be presenting on the topic of “A Universal Test Assembler for the Automated Production of Fixed-Form Tests, Adaptive Tests, and Any Mixture of the Two.”
An interest is developing in testing formats that combine aspects of fixed-form and adaptive testing that suit the practical context of educational, psychological or licensure/certification testing best.
The purpose of the session is to introduce a universal automated test assembler that guarantees real-time generated test forms meeting the same test specifications with any desired format. It is discussed how to configure the assembler to meet both functional and non-functional requirements, including content blueprints, presence of set-based items, adaptation to test-taker proficiencies within a common passage or stimulus, control of the item-exposure rates, inclusion of field-test items while providing for the same “look and feel” of the test, options for test takers to navigate among items, accommodation of large numbers of concurrent users, etc.
The hour-long session is scheduled for Friday, September 30 at 10:30AM, and will include two 20-minute presentations followed by audience discussion.
We hope to see you there!